Effect of Variability in SWCNT-Based Logic Gates
Effect of Variability in SWCNT-Based Logic Gates
This work is concerned with Carbon Nanotube diameter variations and the resulting uncertainties on the behavior of logic gates made from Single Walled Carbon Nanotubes (SWCNTs). Monte Carlo simulations were performed for logic gates based on CNTs of different mean diameters using the Stanford CNFET model. Delay characteristics of logic gates (NOT, NAND, NOR) are studied. This work reveals that logic gates employing SWCNTs with mean diameters greater than about 1.2 nm, show less variation in their timing characteristics, provided that a CNT diameter standard deviation of less than 0.1nm can be guaranteed by a technology process.
Shahidipour, Hamed
74b0912b-8e97-437d-8eed-061bc98fdafa
Ahmadi, Arash
c88cc469-b208-4dad-9541-af5e555e0748
Maharatna, Koushik
93bef0a2-e011-4622-8c56-5447da4cd5dd
December 2009
Shahidipour, Hamed
74b0912b-8e97-437d-8eed-061bc98fdafa
Ahmadi, Arash
c88cc469-b208-4dad-9541-af5e555e0748
Maharatna, Koushik
93bef0a2-e011-4622-8c56-5447da4cd5dd
Shahidipour, Hamed, Ahmadi, Arash and Maharatna, Koushik
(2009)
Effect of Variability in SWCNT-Based Logic Gates.
International Symposium on Integrated Circuits (ISIC2009), Singapore.
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Abstract
This work is concerned with Carbon Nanotube diameter variations and the resulting uncertainties on the behavior of logic gates made from Single Walled Carbon Nanotubes (SWCNTs). Monte Carlo simulations were performed for logic gates based on CNTs of different mean diameters using the Stanford CNFET model. Delay characteristics of logic gates (NOT, NAND, NOR) are studied. This work reveals that logic gates employing SWCNTs with mean diameters greater than about 1.2 nm, show less variation in their timing characteristics, provided that a CNT diameter standard deviation of less than 0.1nm can be guaranteed by a technology process.
Text
P0265.pdf
- Accepted Manuscript
More information
Published date: December 2009
Additional Information:
Event Dates: 16/12/2009
Venue - Dates:
International Symposium on Integrated Circuits (ISIC2009), Singapore, 2009-12-16
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 267985
URI: http://eprints.soton.ac.uk/id/eprint/267985
PURE UUID: 44f619cc-9ebb-42fb-9031-de6e44834057
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Date deposited: 01 Oct 2009 18:42
Last modified: 14 Mar 2024 09:02
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Contributors
Author:
Hamed Shahidipour
Author:
Arash Ahmadi
Author:
Koushik Maharatna
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