Tagged repair techniques for defect tolerance in hybrid nano/CMOS architecture
Tagged repair techniques for defect tolerance in hybrid nano/CMOS architecture
We propose two new repair techniques for hybrid nano/CMOS computing architecture with lookup table based Boolean logic. Our proposed techniques use tagging mechanism to provide high level of defect tolerance and we present theoretical equations to predict the repair capability including an estimate of the repair cost. The repair techniques are efficient in utilization of spare units and capable of targeting upto 20% defect rates, which is higher than recently reported repair techniques.
424-432
Srivastava, Saket
0883e5c1-bc1d-4c46-84a8-a1d9a0a91513
Melouki, Aissa
53a74b6f-f54d-4cd4-89cb-d972c253ce05
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
May 2011
Srivastava, Saket
0883e5c1-bc1d-4c46-84a8-a1d9a0a91513
Melouki, Aissa
53a74b6f-f54d-4cd4-89cb-d972c253ce05
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Srivastava, Saket, Melouki, Aissa and Al-Hashimi, Bashir
(2011)
Tagged repair techniques for defect tolerance in hybrid nano/CMOS architecture.
IEEE Transactions on Nanotechnology, 10 (3), .
(doi:10.1109/TNANO.2010.2045393).
Abstract
We propose two new repair techniques for hybrid nano/CMOS computing architecture with lookup table based Boolean logic. Our proposed techniques use tagging mechanism to provide high level of defect tolerance and we present theoretical equations to predict the repair capability including an estimate of the repair cost. The repair techniques are efficient in utilization of spare units and capable of targeting upto 20% defect rates, which is higher than recently reported repair techniques.
Text
TaggedRepairTechniquesNanoCmosArch.pdf
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Submitted date: March 2010
Published date: May 2011
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 268583
URI: http://eprints.soton.ac.uk/id/eprint/268583
PURE UUID: c974b6ec-9b24-4881-b4ad-38a7bbeb1087
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Date deposited: 09 Mar 2010 20:52
Last modified: 14 Mar 2024 09:13
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Contributors
Author:
Saket Srivastava
Author:
Aissa Melouki
Author:
Bashir Al-Hashimi
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