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Automated critical device identification for configurable analogue transistors

Automated critical device identification for configurable analogue transistors
Automated critical device identification for configurable analogue transistors
858-861
Rudolf, Robert
83a73233-ff6f-4d49-919c-c59f4b31c196
Taatizadeh, P.
3ae9894a-950e-42e4-b33a-c4425f5e3ab4
Wilson, Peter R.
8a65c092-c197-4f43-b8fc-e12977783cb3
Wilcock, Reuben
039894e9-f32d-49e0-9ebd-fb13bc489feb
Rudolf, Robert
83a73233-ff6f-4d49-919c-c59f4b31c196
Taatizadeh, P.
3ae9894a-950e-42e4-b33a-c4425f5e3ab4
Wilson, Peter R.
8a65c092-c197-4f43-b8fc-e12977783cb3
Wilcock, Reuben
039894e9-f32d-49e0-9ebd-fb13bc489feb

Rudolf, Robert, Taatizadeh, P., Wilson, Peter R. and Wilcock, Reuben (2012) Automated critical device identification for configurable analogue transistors. Design Automation and Test Europe. pp. 858-861 .

Record type: Conference or Workshop Item (Paper)
Text
CAT paper09.docx - Author's Original
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Published date: March 2012
Venue - Dates: Design Automation and Test Europe, 2012-03-01
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 351970
URI: http://eprints.soton.ac.uk/id/eprint/351970
PURE UUID: f18ca29a-f24b-44a6-9c00-8a285b249f59

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Date deposited: 27 Apr 2013 07:14
Last modified: 19 Jul 2019 21:37

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