Rudolf, Robert, Taatizadeh, P., Wilson, Peter R. and Wilcock, Reuben (2012) Automated critical device identification for configurable analogue transistors. Design Automation and Test Europe. pp. 858-861 .
Record type:
Conference or Workshop Item
(Paper)
More information
Published date: March 2012
Venue - Dates:
Design Automation and Test Europe, 2012-03-01
Organisations:
Electronics & Computer Science, EEE
Identifiers
Local EPrints ID: 351970
URI: http://eprints.soton.ac.uk/id/eprint/351970
PURE UUID: f18ca29a-f24b-44a6-9c00-8a285b249f59
Catalogue record
Date deposited: 27 Apr 2013 07:14
Last modified: 19 Jul 2019 21:37
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Contributors
Author:
Robert Rudolf
Author:
P. Taatizadeh
Author:
Peter R. Wilson
Author:
Reuben Wilcock
University divisions
- Faculties (pre 2018 reorg) > Faculty of Physical Sciences and Engineering (pre 2018 reorg) > Electronics & Computer Science (pre 2018 reorg) > EEE (pre 2018 reorg)
Current Faculties > Faculty of Engineering and Physical Sciences > School of Electronics and Computer Science > Electronics & Computer Science (pre 2018 reorg) > EEE (pre 2018 reorg)
School of Electronics and Computer Science > Electronics & Computer Science (pre 2018 reorg) > EEE (pre 2018 reorg) - Faculties (pre 2018 reorg) > Faculty of Physical Sciences and Engineering (pre 2018 reorg) > Electronics & Computer Science (pre 2018 reorg)
Current Faculties > Faculty of Engineering and Physical Sciences > School of Electronics and Computer Science > Electronics & Computer Science (pre 2018 reorg)
School of Electronics and Computer Science > Electronics & Computer Science (pre 2018 reorg)
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