Khan, Umar, French, Mark and Chong, Harold (2013) Full beam atomic force microscopy. International Conference on Automation and Computing, London, United Kingdom. 13 - 14 Sep 2013.
Record type:
Conference or Workshop Item
(Paper)
More information
Published date: September 2013
Venue - Dates:
International Conference on Automation and Computing, London, United Kingdom, 2013-09-13 - 2013-09-14
Related URLs:
Organisations:
Electronics & Computer Science
Identifiers
Local EPrints ID: 359938
URI: http://eprints.soton.ac.uk/id/eprint/359938
PURE UUID: c109eeee-cc7d-420e-a3ef-2cde7024156e
Catalogue record
Date deposited: 18 Nov 2013 13:29
Last modified: 15 Mar 2024 03:30
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Contributors
Author:
Umar Khan
Author:
Mark French
Author:
Harold Chong
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