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Full beam atomic force microscopy

Khan, Umar, French, Mark and Chong, Harold (2013) Full beam atomic force microscopy At International Conference on Automation and Computing, United Kingdom. 13 - 14 Sep 2013.

Record type: Conference or Workshop Item (Paper)
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Published date: September 2013
Venue - Dates: International Conference on Automation and Computing, United Kingdom, 2013-09-13 - 2013-09-14
Organisations: Electronics & Computer Science


Local EPrints ID: 359938
PURE UUID: c109eeee-cc7d-420e-a3ef-2cde7024156e

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Date deposited: 18 Nov 2013 13:29
Last modified: 18 Jul 2017 03:16

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Author: Umar Khan
Author: Mark French
Author: Harold Chong

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