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Microstructural investigation on the grain refinement occurring in Cu-doped Ni-Ti thin films

Microstructural investigation on the grain refinement occurring in Cu-doped Ni-Ti thin films
Microstructural investigation on the grain refinement occurring in Cu-doped Ni-Ti thin films
The mechanism of grain refinement in Cu-doped Ni-Ti thin films have been investigated by transmission electron microscopy (TEM). Sputter deposited (Ni,Cu)-rich Ni-Ti-Cu thin films exhibited a columnar structure consisting of grains with a decreasing lateral size with increasing Cu content. Cu-rich grain boundary segregations were found to become prominent in films containing higher Cu contents. These segregations were attributed to a non-polymorphic crystallisation process which lowered the grain growth rate in relation to the Cu content in the films.
1359-6462
52-55
CALLISTI, MAURO
86e03724-aacc-46d5-bccc-4c7025556667
Mellor, B.G.
2b13b80f-880b-49ac-82fe-827a15dde2fe
Polcar, Tomas
c669b663-3ba9-4e7b-9f97-8ef5655ac6d2
CALLISTI, MAURO
86e03724-aacc-46d5-bccc-4c7025556667
Mellor, B.G.
2b13b80f-880b-49ac-82fe-827a15dde2fe
Polcar, Tomas
c669b663-3ba9-4e7b-9f97-8ef5655ac6d2

CALLISTI, MAURO, Mellor, B.G. and Polcar, Tomas (2014) Microstructural investigation on the grain refinement occurring in Cu-doped Ni-Ti thin films. Scripta Materialia, 77, 52-55. (doi:10.1016/j.scriptamat.2014.01.021).

Record type: Article

Abstract

The mechanism of grain refinement in Cu-doped Ni-Ti thin films have been investigated by transmission electron microscopy (TEM). Sputter deposited (Ni,Cu)-rich Ni-Ti-Cu thin films exhibited a columnar structure consisting of grains with a decreasing lateral size with increasing Cu content. Cu-rich grain boundary segregations were found to become prominent in films containing higher Cu contents. These segregations were attributed to a non-polymorphic crystallisation process which lowered the grain growth rate in relation to the Cu content in the films.

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More information

e-pub ahead of print date: 25 January 2014
Published date: 15 April 2014
Organisations: Engineering Science Unit

Identifiers

Local EPrints ID: 365800
URI: http://eprints.soton.ac.uk/id/eprint/365800
ISSN: 1359-6462
PURE UUID: 7d7dc7de-3f68-4bc4-875a-684446bcb3fd
ORCID for Tomas Polcar: ORCID iD orcid.org/0000-0002-0863-6287

Catalogue record

Date deposited: 17 Jun 2014 08:56
Last modified: 15 Mar 2024 03:40

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Contributors

Author: MAURO CALLISTI
Author: B.G. Mellor
Author: Tomas Polcar ORCID iD

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