Electrical transport properties of isolated carbon nanotube/Si heterojunction Schottky diodes
Electrical transport properties of isolated carbon nanotube/Si heterojunction Schottky diodes
A detailed study of the electrical transport properties of Pd contacted carbon nanotube (CNT)/Si heterojunctions is presented. The CNT with a diameter ranging from 1.2 to 2.0?nm on n-type Si substrates showed rectifying behavior with the ideality factor of 1.1–2.2 and turn on voltage of 0.05–0.34?V. The current-voltage characteristics of the CNT/n+-Si diodes were investigated in the temperature range from 50 to 300?K. The transition from thermionic emission to tunneling process was seen in the forward current around 150?K and the Schottky barrier height at Pd/CNT interface is estimated to be 0.3–0.5?eV.
1-3
Uchino, T.
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Shimpo, F.
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Kawashima, T.
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Ayre, G.N.
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Smith, D.C.
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de Groot, C.H.
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Ashburn, P.
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2 January 2014
Uchino, T.
706196b8-2f2c-403d-97aa-2995eac8572b
Shimpo, F.
71a85a54-0270-4c7b-b22c-f2b2dd700a60
Kawashima, T.
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Ayre, G.N.
0a7c003b-00c1-4412-bd40-03005e7310c2
Smith, D.C.
d9b2c02d-b7ea-498b-9ea1-208a1681536f
de Groot, C.H.
92cd2e02-fcc4-43da-8816-c86f966be90c
Ashburn, P.
68cef6b7-205b-47aa-9efb-f1f09f5c1038
Uchino, T., Shimpo, F., Kawashima, T., Ayre, G.N., Smith, D.C., de Groot, C.H. and Ashburn, P.
(2014)
Electrical transport properties of isolated carbon nanotube/Si heterojunction Schottky diodes.
Applied Physics Letters, 103 (19), .
(doi:10.1063/1.4829155).
Abstract
A detailed study of the electrical transport properties of Pd contacted carbon nanotube (CNT)/Si heterojunctions is presented. The CNT with a diameter ranging from 1.2 to 2.0?nm on n-type Si substrates showed rectifying behavior with the ideality factor of 1.1–2.2 and turn on voltage of 0.05–0.34?V. The current-voltage characteristics of the CNT/n+-Si diodes were investigated in the temperature range from 50 to 300?K. The transition from thermionic emission to tunneling process was seen in the forward current around 150?K and the Schottky barrier height at Pd/CNT interface is estimated to be 0.3–0.5?eV.
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Takashi_L13_09320R.pdf
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e-pub ahead of print date: November 2013
Published date: 2 January 2014
Organisations:
Physics & Astronomy, Electronics & Computer Science
Identifiers
Local EPrints ID: 367546
URI: http://eprints.soton.ac.uk/id/eprint/367546
ISSN: 0003-6951
PURE UUID: 0cbb6e20-1224-4406-8309-5ba6f9799a2c
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Date deposited: 31 Jul 2014 14:03
Last modified: 15 Mar 2024 03:11
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Author:
T. Uchino
Author:
F. Shimpo
Author:
T. Kawashima
Author:
G.N. Ayre
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