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Locally erasable couplers for optical device testing in silicon on insulator

Locally erasable couplers for optical device testing in silicon on insulator
Locally erasable couplers for optical device testing in silicon on insulator
Wafer scale testing is critical to reducing production costs and increasing production yield. Here we report a method that allows testing of individual optical components within a complex optical integrated circuit. The method is based on diffractive grating couplers, fabricated using lattice damage induced by ion implantation of germanium. These gratings can be erased via localised laser annealing, which is shown to reduce the outcoupling efficiency by over 20 dB after the device testing is completed. Laser annealing was achieved by employing a CW laser, operating at visible wavelengths thus reducing equipment costs and allowing annealing through thick oxide claddings. The process used also retains CMOS compatibility.
0733-8724
2248-2253
Topley, R.P.
f43e052f-31c2-47a5-a627-3ce44fbc99a1
Martinez-Jimenez, G.
6f3b34dd-33de-42b0-a69d-56e724da239b
O'Faolain, L.
a3225d11-a3e4-47bc-a601-e2dca9020ad3
Healy, N.
26eec85c-8d12-4f21-a67a-022f8dc2daab
Mailis, S.
233e0768-3f8d-430e-8fdf-92e6f4f6a0c4
Thomson, D.J.
17c1626c-2422-42c6-98e0-586ae220bcda
Gardes, F.Y.
7a49fc6d-dade-4099-b016-c60737cb5bb2
Peacock, A.C.
685d924c-ef6b-401b-a0bd-acf1f8e758fc
Payne, D.N.R.
50b6610f-a762-4b72-850a-60726220fd32
Mashanovich, G.Z.
c806e262-af80-4836-b96f-319425060051
Reed, G.T.
ca08dd60-c072-4d7d-b254-75714d570139
Topley, R.P.
f43e052f-31c2-47a5-a627-3ce44fbc99a1
Martinez-Jimenez, G.
6f3b34dd-33de-42b0-a69d-56e724da239b
O'Faolain, L.
a3225d11-a3e4-47bc-a601-e2dca9020ad3
Healy, N.
26eec85c-8d12-4f21-a67a-022f8dc2daab
Mailis, S.
233e0768-3f8d-430e-8fdf-92e6f4f6a0c4
Thomson, D.J.
17c1626c-2422-42c6-98e0-586ae220bcda
Gardes, F.Y.
7a49fc6d-dade-4099-b016-c60737cb5bb2
Peacock, A.C.
685d924c-ef6b-401b-a0bd-acf1f8e758fc
Payne, D.N.R.
50b6610f-a762-4b72-850a-60726220fd32
Mashanovich, G.Z.
c806e262-af80-4836-b96f-319425060051
Reed, G.T.
ca08dd60-c072-4d7d-b254-75714d570139

Topley, R.P., Martinez-Jimenez, G., O'Faolain, L., Healy, N., Mailis, S., Thomson, D.J., Gardes, F.Y., Peacock, A.C., Payne, D.N.R., Mashanovich, G.Z. and Reed, G.T. (2014) Locally erasable couplers for optical device testing in silicon on insulator. Journal of Lightwave Technology, 32 (12), 2248-2253. (doi:10.1109/JLT.2014.2324018).

Record type: Article

Abstract

Wafer scale testing is critical to reducing production costs and increasing production yield. Here we report a method that allows testing of individual optical components within a complex optical integrated circuit. The method is based on diffractive grating couplers, fabricated using lattice damage induced by ion implantation of germanium. These gratings can be erased via localised laser annealing, which is shown to reduce the outcoupling efficiency by over 20 dB after the device testing is completed. Laser annealing was achieved by employing a CW laser, operating at visible wavelengths thus reducing equipment costs and allowing annealing through thick oxide claddings. The process used also retains CMOS compatibility.

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More information

e-pub ahead of print date: 21 May 2014
Published date: 15 June 2014
Organisations: Optoelectronics Research Centre, Electronics & Computer Science

Identifiers

Local EPrints ID: 367583
URI: https://eprints.soton.ac.uk/id/eprint/367583
ISSN: 0733-8724
PURE UUID: 5ddd660c-8dbe-4958-ba4f-6ec309433c65
ORCID for S. Mailis: ORCID iD orcid.org/0000-0001-8100-2670
ORCID for A.C. Peacock: ORCID iD orcid.org/0000-0002-1940-7172

Catalogue record

Date deposited: 01 Aug 2014 13:11
Last modified: 14 Dec 2018 01:36

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