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Application-specific memory protection policies for energy-efficient reliable design

Application-specific memory protection policies for energy-efficient reliable design
Application-specific memory protection policies for energy-efficient reliable design
In this paper, we show that the vulnerability of memory components due to data retention in the presence of soft errors exhibit orders of magnitude variations with applications through extensive analysis of MiBench benchmarks. Underpinning such analysis, we propose a novel application-specific design flow for joint energy efficiency and reliability optimization. The energy efficiency is achieved through voltage/frequency scaling (VFS), while reliability is achieved through suitably choosing the appropriate protection policies (L1-Cache resizing and selective ECC) for hierarchical memory components. Fundamental to such joint optimization is a design analysis framework, which can analyze trade-off between memory protection policies considering the impact of VFS, and apply design optimization algorithm to provide with an energy-efficient design, while meeting a given reliability target. Using this framework the proposed design flow is validated through extensive number of application case studies based on ARMv7 processors modeled in GEM5. We show that the joint consideration of cache resizing and VFS can improve the L1-Cache reliability by up to 5x compared to VFS alone, while incurring <10% energy overhead. Additionally, using selective ECC for L2-Cache and DRAM, we show that energy consumption can be reduced by up to 40%
Yang, Sheng
04b9848f-ddd4-4d8f-93b6-b91a2144d49c
Shafik, Rishad Ahmed
aa0bdafc-b022-4cb2-a8ef-4bf8a03ba524
Khursheed, Saqib
0c4e3d52-0df5-43d9-bafe-d2eaea457506
Flynn, David
9cb44648-488b-4f22-b72b-7e5117cd919c
Merrett, Geoff V.
89b3a696-41de-44c3-89aa-b0aa29f54020
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Yang, Sheng
04b9848f-ddd4-4d8f-93b6-b91a2144d49c
Shafik, Rishad Ahmed
aa0bdafc-b022-4cb2-a8ef-4bf8a03ba524
Khursheed, Saqib
0c4e3d52-0df5-43d9-bafe-d2eaea457506
Flynn, David
9cb44648-488b-4f22-b72b-7e5117cd919c
Merrett, Geoff V.
89b3a696-41de-44c3-89aa-b0aa29f54020
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d

Yang, Sheng, Shafik, Rishad Ahmed, Khursheed, Saqib, Flynn, David, Merrett, Geoff V. and Al-Hashimi, Bashir (2015) Application-specific memory protection policies for energy-efficient reliable design. IEEE International ESWEEK Symposium on Rapid System Prototyping, Amsterdam, Netherlands. 08 - 09 Oct 2015. 7 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

In this paper, we show that the vulnerability of memory components due to data retention in the presence of soft errors exhibit orders of magnitude variations with applications through extensive analysis of MiBench benchmarks. Underpinning such analysis, we propose a novel application-specific design flow for joint energy efficiency and reliability optimization. The energy efficiency is achieved through voltage/frequency scaling (VFS), while reliability is achieved through suitably choosing the appropriate protection policies (L1-Cache resizing and selective ECC) for hierarchical memory components. Fundamental to such joint optimization is a design analysis framework, which can analyze trade-off between memory protection policies considering the impact of VFS, and apply design optimization algorithm to provide with an energy-efficient design, while meeting a given reliability target. Using this framework the proposed design flow is validated through extensive number of application case studies based on ARMv7 processors modeled in GEM5. We show that the joint consideration of cache resizing and VFS can improve the L1-Cache reliability by up to 5x compared to VFS alone, while incurring <10% energy overhead. Additionally, using selective ECC for L2-Cache and DRAM, we show that energy consumption can be reduced by up to 40%

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More information

e-pub ahead of print date: October 2015
Venue - Dates: IEEE International ESWEEK Symposium on Rapid System Prototyping, Amsterdam, Netherlands, 2015-10-08 - 2015-10-09
Organisations: Electronic & Software Systems

Identifiers

Local EPrints ID: 380755
URI: http://eprints.soton.ac.uk/id/eprint/380755
PURE UUID: 0d5c2114-97fe-4558-a7b6-025c8f527b1b
ORCID for Geoff V. Merrett: ORCID iD orcid.org/0000-0003-4980-3894

Catalogue record

Date deposited: 17 Sep 2015 10:50
Last modified: 15 Mar 2024 03:23

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Contributors

Author: Sheng Yang
Author: Rishad Ahmed Shafik
Author: Saqib Khursheed
Author: David Flynn
Author: Geoff V. Merrett ORCID iD
Author: Bashir Al-Hashimi

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