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Simulation of the developed electro-thermal aging model based on trapping and detrapping process

Simulation of the developed electro-thermal aging model based on trapping and detrapping process
Simulation of the developed electro-thermal aging model based on trapping and detrapping process
The key aspect of this work is to simulate the evolution of structure damages in polyethylene under the effect of electro-thermal stresses based on the trapping and detrapping aging model. In addition, the susceptibility of the model parameters to the isolated sites during the aging period have also been studied.The simulation work is performed on a 2D square grid that is assumed to represent a part of the insulation. The mesh structure is divided using the finite element method. Based on the nature of polyethylene, its structure is semi-crystalline with a spatially varying morphology. Consequently, each bond in the grid is assigned a set of parameter values. One of these parameters is the critical fraction of trapped charges C*, which needs to be reached in order to fail a bond. It is chosen at random values from a range centered on the characteristic value obtained from the experimental results. This indicates that the insulation life at varying parameter C* is lower than its characteristic value.
ageing, lifetime, electro-thermal breakdown, space charge, decay, conductivity, schottky, trap, detrap, LDPE
9781467374989
Alghamdi, Hisham A.
c7a5dbd4-cffb-4985-a9cd-836c4aa1eaf5
Chen, George
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Vaughan, Alun
6d813b66-17f9-4864-9763-25a6d659d8a3
Alghamdi, Hisham A.
c7a5dbd4-cffb-4985-a9cd-836c4aa1eaf5
Chen, George
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Vaughan, Alun
6d813b66-17f9-4864-9763-25a6d659d8a3

Alghamdi, Hisham A., Chen, George and Vaughan, Alun (2015) Simulation of the developed electro-thermal aging model based on trapping and detrapping process. IEEE Conference on Electrical Insulation and Dielectric Phenomena, United States. 18 - 20 Oct 2015. 5 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

The key aspect of this work is to simulate the evolution of structure damages in polyethylene under the effect of electro-thermal stresses based on the trapping and detrapping aging model. In addition, the susceptibility of the model parameters to the isolated sites during the aging period have also been studied.The simulation work is performed on a 2D square grid that is assumed to represent a part of the insulation. The mesh structure is divided using the finite element method. Based on the nature of polyethylene, its structure is semi-crystalline with a spatially varying morphology. Consequently, each bond in the grid is assigned a set of parameter values. One of these parameters is the critical fraction of trapped charges C*, which needs to be reached in order to fail a bond. It is chosen at random values from a range centered on the characteristic value obtained from the experimental results. This indicates that the insulation life at varying parameter C* is lower than its characteristic value.

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CEIDP2015-000416.pdf - Accepted Manuscript
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More information

Published date: 18 October 2015
Venue - Dates: IEEE Conference on Electrical Insulation and Dielectric Phenomena, United States, 2015-10-18 - 2015-10-20
Keywords: ageing, lifetime, electro-thermal breakdown, space charge, decay, conductivity, schottky, trap, detrap, LDPE
Organisations: EEE

Identifiers

Local EPrints ID: 383628
URI: http://eprints.soton.ac.uk/id/eprint/383628
ISBN: 9781467374989
PURE UUID: c08b4c92-c7f0-4ca6-9099-96ce852292a2
ORCID for Alun Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

Catalogue record

Date deposited: 30 Nov 2015 10:59
Last modified: 20 Jul 2019 01:07

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