Effects of mechanical and electrical coupling on the parametric sensitivity of mode localized sensors
Effects of mechanical and electrical coupling on the parametric sensitivity of mode localized sensors
We compare and contrast the effects of two distinctly different mechanisms of coupling (mechanical and electrical) on the parametric sensitivity of micromechanical sensors utilizing mode localization for sensor applications. For the first time, the strong correlation between mode localization and the phenomenon of 'eigenvalue loci-veering' is exploited for accurate quantification of the strength of internal coupling in mode localized sensors. The effects of capacitive coupling-spring tuning on the parametric sensitivity of electrically coupled resonators utilizing this sensing paradigm is also investigated and a mass sensor with sensitivity tunable by over 400% is realized.
1183-1186
Thiruvenkatanathan, Pradyumna
42613b52-d83d-4fa9-bc40-337201dfa2a0
Yan, Jize
786dc090-843b-435d-adbe-1d35e8fc5828
Woodhouse, Jim
9d16e0d0-94f5-45cd-8359-77c22be83c09
Aziz, A.
859fe7f2-3a73-48fe-907d-fc60eb4c2815
Seshia, A Seshia
5bb5bdcc-c3d7-4dc8-a631-d7149bc7e08e
Thiruvenkatanathan, Pradyumna
42613b52-d83d-4fa9-bc40-337201dfa2a0
Yan, Jize
786dc090-843b-435d-adbe-1d35e8fc5828
Woodhouse, Jim
9d16e0d0-94f5-45cd-8359-77c22be83c09
Aziz, A.
859fe7f2-3a73-48fe-907d-fc60eb4c2815
Seshia, A Seshia
5bb5bdcc-c3d7-4dc8-a631-d7149bc7e08e
Thiruvenkatanathan, Pradyumna, Yan, Jize, Woodhouse, Jim, Aziz, A. and Seshia, A Seshia
(2009)
Effects of mechanical and electrical coupling on the parametric sensitivity of mode localized sensors.
2009 IEEE International Ultrasonics Symposium, Roma, Italy.
20 - 23 Sep 2009.
.
(doi:10.1109/ULTSYM.2009.5441687).
Record type:
Conference or Workshop Item
(Paper)
Abstract
We compare and contrast the effects of two distinctly different mechanisms of coupling (mechanical and electrical) on the parametric sensitivity of micromechanical sensors utilizing mode localization for sensor applications. For the first time, the strong correlation between mode localization and the phenomenon of 'eigenvalue loci-veering' is exploited for accurate quantification of the strength of internal coupling in mode localized sensors. The effects of capacitive coupling-spring tuning on the parametric sensitivity of electrically coupled resonators utilizing this sensing paradigm is also investigated and a mass sensor with sensitivity tunable by over 400% is realized.
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e-pub ahead of print date: 2009
Venue - Dates:
2009 IEEE International Ultrasonics Symposium, Roma, Italy, 2009-09-20 - 2009-09-23
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 398827
URI: http://eprints.soton.ac.uk/id/eprint/398827
PURE UUID: 4038ea89-4c6b-4f9c-88c4-058329e69553
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Date deposited: 03 Aug 2016 10:51
Last modified: 15 Mar 2024 03:53
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Contributors
Author:
Pradyumna Thiruvenkatanathan
Author:
Jim Woodhouse
Author:
A. Aziz
Author:
A Seshia Seshia
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