Chatzikyriakou, Eleni (2016) 22 nm bulk FinFET Total Ionizing Dose simulation. University of Southampton doi:10.5258/SOTON/400301 [Dataset]
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Dataset
Abstract
Dataset to support: Chatzikyriakou, E. et al (2016). Three-dimensional Finite Elements Method simulation of Total Ionizing Dose in 22 nm bulk nFinFETs. Nuclear Inst. and Methods in Physics Research B
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22nm_FinFET_Id_Vg.gzp
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Available under License Creative Commons Attribution.
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22nm_FinFET_Radiation.gzp
- Dataset
Available under License Creative Commons Attribution.
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Published date: 2016
Related URLs:
Organisations:
Electronics & Computer Science
Projects:
Degradation mechanisms in semiconductor logic
Funded by: UNSPECIFIED (1304067)
1 October 2012 to 30 September 2015
Identifiers
Local EPrints ID: 400301
URI: http://eprints.soton.ac.uk/id/eprint/400301
PURE UUID: a79e5b37-37ec-4aee-b509-b0a41e27e880
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Date deposited: 23 Sep 2016 10:52
Last modified: 04 Nov 2023 15:09
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Contributors
Creator:
Eleni Chatzikyriakou
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