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22 nm bulk FinFET Total Ionizing Dose simulation

22 nm bulk FinFET Total Ionizing Dose simulation
22 nm bulk FinFET Total Ionizing Dose simulation
Dataset to support: Chatzikyriakou, E. et al (2016). Three-dimensional Finite Elements Method simulation of Total Ionizing Dose in 22 nm bulk nFinFETs. Nuclear Inst. and Methods in Physics Research B
University of Southampton
Chatzikyriakou, Eleni
3898b429-c7ef-42a3-8fca-d6e8c85b27fb
Chatzikyriakou, Eleni
3898b429-c7ef-42a3-8fca-d6e8c85b27fb

Chatzikyriakou, Eleni (2016) 22 nm bulk FinFET Total Ionizing Dose simulation. University of Southampton doi:10.5258/SOTON/400301 [Dataset]

Record type: Dataset

Abstract

Dataset to support: Chatzikyriakou, E. et al (2016). Three-dimensional Finite Elements Method simulation of Total Ionizing Dose in 22 nm bulk nFinFETs. Nuclear Inst. and Methods in Physics Research B

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22nm_FinFET_Id_Vg.gzp - Dataset
Available under License Creative Commons Attribution.
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Other
22nm_FinFET_Radiation.gzp - Dataset
Available under License Creative Commons Attribution.
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Text
README.pdf - Text
Available under License Creative Commons Attribution.
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License - Text
Available under License Creative Commons Attribution.
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More information

Published date: 2016
Organisations: Electronics & Computer Science
Projects:
Degradation mechanisms in semiconductor logic
Funded by: UNSPECIFIED (1304067)
1 October 2012 to 30 September 2015

Identifiers

Local EPrints ID: 400301
URI: http://eprints.soton.ac.uk/id/eprint/400301
PURE UUID: a79e5b37-37ec-4aee-b509-b0a41e27e880
ORCID for Eleni Chatzikyriakou: ORCID iD orcid.org/0000-0002-5624-3701

Catalogue record

Date deposited: 23 Sep 2016 10:52
Last modified: 05 Oct 2018 12:20

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Contributors

Creator: Eleni Chatzikyriakou ORCID iD

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