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Wear resistance and electroconductivity in a Cu–0.3Cr–0.5Zr alloy processed by ECAP

Wear resistance and electroconductivity in a Cu–0.3Cr–0.5Zr alloy processed by ECAP
Wear resistance and electroconductivity in a Cu–0.3Cr–0.5Zr alloy processed by ECAP
The ultrafine-grained microstructures and functional properties, including wear resistance for dry sliding and electrical conductivity, were investigated in a Cu–0.3 %Cr–0.5 %Zr alloy processed by equal-channel angular pressing (ECAP) at a temperature of 400 °C to total strains of 1, 2, and 4. Severe plastic deformation by ECAP to a total strain of ~1 led to a significant decrease in the wear resistance because of the rapid surface damage to both solution-treated (ST) and aged (AT) samples where a high density of dislocations was arranged in stochastic low-angle subboundaries by brittle fracture. Further deformation by subsequent ECAP passes promoted the subdivision of the shear bands by geometrically necessary boundaries. Correspondingly, the number of fine crystallites outlined by high-angle boundaries increased, and the wear rate decreased. After four ECAP passes, the wear rate decreased to the level of the initial state of the alloy and equaled 1.68 × 10?5 mm3/(N m) and 1.40 × 10?5 mm3/(N m) for ST and AT samples, respectively. The results demonstrate that the damage mechanism is the controlling factor for wear resistance of Cu–Cr–Zr bronze hardened by intense plastic straining.
0022-2461
305-313
Zhilyaev, A.P.
d053e518-1976-4633-8953-e8f34b9b7c44
Morozova, A.
7df1342e-5a78-45a9-a25b-60089d435edf
Cabrera, J. M.
79e11932-956a-493c-97ff-96eee8bd8baa
Kaibyshev, R.
50740e0c-6465-4033-8379-38dcee0d6b4e
Langdon, T.G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Zhilyaev, A.P.
d053e518-1976-4633-8953-e8f34b9b7c44
Morozova, A.
7df1342e-5a78-45a9-a25b-60089d435edf
Cabrera, J. M.
79e11932-956a-493c-97ff-96eee8bd8baa
Kaibyshev, R.
50740e0c-6465-4033-8379-38dcee0d6b4e
Langdon, T.G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86

Zhilyaev, A.P., Morozova, A., Cabrera, J. M., Kaibyshev, R. and Langdon, T.G. (2017) Wear resistance and electroconductivity in a Cu–0.3Cr–0.5Zr alloy processed by ECAP. Journal of Materials Science, 52, 305-313. (doi:10.1007/s10853-016-0331-8).

Record type: Article

Abstract

The ultrafine-grained microstructures and functional properties, including wear resistance for dry sliding and electrical conductivity, were investigated in a Cu–0.3 %Cr–0.5 %Zr alloy processed by equal-channel angular pressing (ECAP) at a temperature of 400 °C to total strains of 1, 2, and 4. Severe plastic deformation by ECAP to a total strain of ~1 led to a significant decrease in the wear resistance because of the rapid surface damage to both solution-treated (ST) and aged (AT) samples where a high density of dislocations was arranged in stochastic low-angle subboundaries by brittle fracture. Further deformation by subsequent ECAP passes promoted the subdivision of the shear bands by geometrically necessary boundaries. Correspondingly, the number of fine crystallites outlined by high-angle boundaries increased, and the wear rate decreased. After four ECAP passes, the wear rate decreased to the level of the initial state of the alloy and equaled 1.68 × 10?5 mm3/(N m) and 1.40 × 10?5 mm3/(N m) for ST and AT samples, respectively. The results demonstrate that the damage mechanism is the controlling factor for wear resistance of Cu–Cr–Zr bronze hardened by intense plastic straining.

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APZ-CuCrZrManuscript_JMS-TGL.doc - Accepted Manuscript
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Accepted/In Press date: 22 August 2016
e-pub ahead of print date: 30 August 2016
Published date: January 2017
Organisations: Engineering Mats & Surface Engineerg Gp

Identifiers

Local EPrints ID: 400821
URI: http://eprints.soton.ac.uk/id/eprint/400821
ISSN: 0022-2461
PURE UUID: 45c350e8-dd1a-43a3-9e5a-5931ca0a013a
ORCID for T.G. Langdon: ORCID iD orcid.org/0000-0003-3541-9250

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Date deposited: 27 Sep 2016 15:36
Last modified: 15 Mar 2024 05:55

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Contributors

Author: A.P. Zhilyaev
Author: A. Morozova
Author: J. M. Cabrera
Author: R. Kaibyshev
Author: T.G. Langdon ORCID iD

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