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A theoretical treatment of void electromigration in the strip geometry

A theoretical treatment of void electromigration in the strip geometry
A theoretical treatment of void electromigration in the strip geometry
The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted
0927-0256
279-289
Ben Amar, Martine
642b3f67-e9e6-4fe2-a385-30ca2ca50260
Cummings, Linda
70a32c64-8b0a-4740-a3bd-598866668be5
Richardson, Giles
3fd8e08f-e615-42bb-a1ff-3346c5847b91
Ben Amar, Martine
642b3f67-e9e6-4fe2-a385-30ca2ca50260
Cummings, Linda
70a32c64-8b0a-4740-a3bd-598866668be5
Richardson, Giles
3fd8e08f-e615-42bb-a1ff-3346c5847b91

Ben Amar, Martine, Cummings, Linda and Richardson, Giles (2000) A theoretical treatment of void electromigration in the strip geometry. Computational Materials Science, 17 (2-4), 279-289. (doi:10.1016/S0927-0256(00)00039-2).

Record type: Article

Abstract

The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted

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Published date: 2 June 2000
Organisations: Applied Mathematics

Identifiers

Local EPrints ID: 404027
URI: http://eprints.soton.ac.uk/id/eprint/404027
ISSN: 0927-0256
PURE UUID: 37fee0a3-9639-4b12-9c31-7ba012fa9436

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Date deposited: 22 Dec 2016 15:22
Last modified: 19 Jul 2019 19:31

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Contributors

Author: Martine Ben Amar
Author: Linda Cummings

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