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Tailoring the refractive index of films during pulsed laser deposition growth

Tailoring the refractive index of films during pulsed laser deposition growth
Tailoring the refractive index of films during pulsed laser deposition growth
Pulsed laser deposition (PLD) enables the epitaxial growth of crystalline films using material transfer, from a target to a substrate, via a plasma-plume created during laser ablation. Owing to the several experimental controls available in PLD, which can be adjusted during deposition, this is an excellent tool for growing designer films through altering film parameters such as stoichiometry, crystallinity and thickness [1, 2].

We will present the effects on the refractive index of thin garnet films grown via PLD when varying the temperature of the substrate, onto which the films are grown. Our results show that monotonic control of the YGG refractive index with substrate temperature is possible whilst maintaining good crystal properties. It was observed that at higher substrate temperatures, the gallium content in the crystal is reducing, supported by EDX and XRD measurements, which leads to a decrease in the refractive index of the film. This technique can therefore be used for the fabrication of advanced devices with bespoke refractive index profiles and engineered dielectric properties of composite materials.
1. J. A. Grant-Jacob et al. Opt. Mater. Express 6, 91-96 (2016)
2. T. L. Parsonage et al. Opt. Express 23, 31691-31697 (2015)
Q PW.15
Grant-Jacob, James
c5d144d8-3c43-4195-8e80-edd96bfda91b
Beecher, Stephen
b3664adc-d6b5-4a5a-a09a-8e1415c6d3f5
Shepherd, David
9fdd51c4-39d6-41b3-9021-4c033c2f4ead
Eason, Robert
e38684c3-d18c-41b9-a4aa-def67283b020
Mackenzie, Jacob
1d82c826-fdbf-425b-ac04-be43ccf12008
Grant-Jacob, James
c5d144d8-3c43-4195-8e80-edd96bfda91b
Beecher, Stephen
b3664adc-d6b5-4a5a-a09a-8e1415c6d3f5
Shepherd, David
9fdd51c4-39d6-41b3-9021-4c033c2f4ead
Eason, Robert
e38684c3-d18c-41b9-a4aa-def67283b020
Mackenzie, Jacob
1d82c826-fdbf-425b-ac04-be43ccf12008

Grant-Jacob, James, Beecher, Stephen, Shepherd, David, Eason, Robert and Mackenzie, Jacob (2017) Tailoring the refractive index of films during pulsed laser deposition growth. E-MRS 2017 Spring Meeting, Strasbourg, France. 21 - 26 May 2017. Q PW.15 .

Record type: Conference or Workshop Item (Other)

Abstract

Pulsed laser deposition (PLD) enables the epitaxial growth of crystalline films using material transfer, from a target to a substrate, via a plasma-plume created during laser ablation. Owing to the several experimental controls available in PLD, which can be adjusted during deposition, this is an excellent tool for growing designer films through altering film parameters such as stoichiometry, crystallinity and thickness [1, 2].

We will present the effects on the refractive index of thin garnet films grown via PLD when varying the temperature of the substrate, onto which the films are grown. Our results show that monotonic control of the YGG refractive index with substrate temperature is possible whilst maintaining good crystal properties. It was observed that at higher substrate temperatures, the gallium content in the crystal is reducing, supported by EDX and XRD measurements, which leads to a decrease in the refractive index of the film. This technique can therefore be used for the fabrication of advanced devices with bespoke refractive index profiles and engineered dielectric properties of composite materials.
1. J. A. Grant-Jacob et al. Opt. Mater. Express 6, 91-96 (2016)
2. T. L. Parsonage et al. Opt. Express 23, 31691-31697 (2015)

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EMRS_2017_Index JGJ_Final - Accepted Manuscript
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More information

Accepted/In Press date: 28 February 2017
Published date: May 2017
Venue - Dates: E-MRS 2017 Spring Meeting, Strasbourg, France, 2017-05-21 - 2017-05-26
Organisations: Optoelectronics Research Centre, Faculty of Physical Sciences and Engineering

Identifiers

Local EPrints ID: 406850
URI: https://eprints.soton.ac.uk/id/eprint/406850
PURE UUID: 2a7ea4a1-7a41-40bd-a6bd-3d2fae851d5d
ORCID for James Grant-Jacob: ORCID iD orcid.org/0000-0002-4270-4247
ORCID for David Shepherd: ORCID iD orcid.org/0000-0002-4561-8184
ORCID for Robert Eason: ORCID iD orcid.org/0000-0001-9704-2204
ORCID for Jacob Mackenzie: ORCID iD orcid.org/0000-0002-3355-6051

Catalogue record

Date deposited: 24 Mar 2017 02:05
Last modified: 14 Mar 2019 01:55

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