(2017) Data for 'Impact of ultra-thin Al2O3–y layers on TiO2–x ReRAM switching characteristics'. University of Southampton doi:10.5258/SOTON/D0055 [Dataset]
Abstract
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ave used ultra-thin Al2O3-y buffer layers incorporated between TiO2-x thin 
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reservoirs of oxygen vacancies which are injected during EF, facilitate a 
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g EF, facilitate a lamentary switching mechanism and provide enhanced 
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