The University of Southampton
University of Southampton Institutional Repository

Reliability of analogue circuits

Reliability of analogue circuits
Reliability of analogue circuits
The reliability of CMOS circuits has worsened due to technology scaling. From the review of previous work on reliability study for CMOS circuits, it has been found that both digital and analogue circuits were susceptible to single event effects. Single event effects although causing non-permanent errors have already been identified to have caused billion of dollars worth of lost. Single event transients have been established as one of the single event effects which may reduce the reliability of analogue circuits and safety critical systems, in general. The impact of radiation effects on analogue circuits has been investigated in this thesis using circuit-level single event transient modelling. The characterization of impact of single event transient has been investigated for several analogue circuits. These analogue circuits; namely operational amplifier and comparator, have been recognized to be susceptible to single event transients. Several influencing factors have been associated with previous works and this study to have impacts on the severity of the single event transients to these circuits. Sensitivity analysis has been completed to determine the most and the least sensitive transistor to be used in the variability analysis. The variability analysis addresses the impact of the influencing factors and this information may be used in finding the trade-off which exists between the influencing factors and single event transient. These trade-offs may also be used in mitigating the single event transient. A simple mitigation technique still at preliminary stage has also been included, as part of this study.
University of Southampton
Mohd Nawi, Illani Binti
a1009275-5f33-43c5-b414-1a02830c93f2
Mohd Nawi, Illani Binti
a1009275-5f33-43c5-b414-1a02830c93f2
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33

Mohd Nawi, Illani Binti (2018) Reliability of analogue circuits. University of Southampton, Doctoral Thesis, 192pp.

Record type: Thesis (Doctoral)

Abstract

The reliability of CMOS circuits has worsened due to technology scaling. From the review of previous work on reliability study for CMOS circuits, it has been found that both digital and analogue circuits were susceptible to single event effects. Single event effects although causing non-permanent errors have already been identified to have caused billion of dollars worth of lost. Single event transients have been established as one of the single event effects which may reduce the reliability of analogue circuits and safety critical systems, in general. The impact of radiation effects on analogue circuits has been investigated in this thesis using circuit-level single event transient modelling. The characterization of impact of single event transient has been investigated for several analogue circuits. These analogue circuits; namely operational amplifier and comparator, have been recognized to be susceptible to single event transients. Several influencing factors have been associated with previous works and this study to have impacts on the severity of the single event transients to these circuits. Sensitivity analysis has been completed to determine the most and the least sensitive transistor to be used in the variability analysis. The variability analysis addresses the impact of the influencing factors and this information may be used in finding the trade-off which exists between the influencing factors and single event transient. These trade-offs may also be used in mitigating the single event transient. A simple mitigation technique still at preliminary stage has also been included, as part of this study.

Text
Final Thesis - Author's Original
Restricted to Repository staff only
Text
Reliability of Analogue Electronics - Version of Record
Available under License University of Southampton Thesis Licence.
Download (17MB)

More information

Published date: 6 September 2018

Identifiers

Local EPrints ID: 423575
URI: http://eprints.soton.ac.uk/id/eprint/423575
PURE UUID: e6886fd0-bcf8-4f69-82b0-8d3b0a907c48
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X
ORCID for Basel Halak: ORCID iD orcid.org/0000-0003-3470-7226

Catalogue record

Date deposited: 26 Sep 2018 16:30
Last modified: 14 Mar 2019 01:55

Export record

Contributors

Author: Illani Binti Mohd Nawi
Thesis advisor: Mark Zwolinski ORCID iD
Thesis advisor: Basel Halak ORCID iD

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×