Silicon single-electron random number generator based on random telegraph signals at room temperature
Silicon single-electron random number generator based on random telegraph signals at room temperature
The need for hardware random number generators (HRNGs) that can be integrated in a silicon (Si) complementary-metal-oxide-semiconductor (CMOS) platform has become increasingly important in the era of the Internet-of-Things (IoT). Si MOSFETs exhibiting random telegraph signals (RTSs) have been considered as such a candidate for HRNG, though its application has been hindered by RTS's variability and uncontrollable, unpredictable characteristics. In this paper, we report the generation and randomness evaluation of random numbers from RTSs in a Si single electron pump (SEP) device at room temperature. SEP devices are known to consistently produce RTSs due to a quantum dot electrically defined by multi-layer polycrystalline Si gates. Using RTSs observed in our devices, random numbers were extracted by a classifier supported by supervised learning, where part of data was used to train the classifier before it is applied to the rest to generate random numbers. The random numbers generated from RTSs were used as inputs for the Monte Carlo method to calculate the values of π, and the distribution was compared against the result obtained from the Mersenne Twister, a representative pseudo-random number generator (PRNG), under the same condition. π was estimated more than 80 000 times, and the distribution of the estimated values has a central value of 3.14 with a variance of 0.273, which is only twice as large as the result from PRNG. Our result paves a way to fully electronic CMOS compatible HRNGs that can be integrated in a modern system-on-a-chip in IoT devices.
Ibukuro, Kouta
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Liu, Fayong
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Husain, Muhammad K
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Sotto, Moise Sala Henri
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Hillier, Joseph William
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Li, Zuo
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Tomita, Isao
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Tsuchiya, Yoshishige
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Rutt, Harvey
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Saito, Shinichi
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2 November 2020
Ibukuro, Kouta
b863054f-39db-4e0e-a2cb-981a86820dda
Liu, Fayong
beec7ff8-5835-4793-981b-fafd99b52549
Husain, Muhammad K
92db1f76-6760-4cf2-8e30-5d4a602fe15b
Sotto, Moise Sala Henri
2e7797fc-4433-4513-bd08-03ab7839452c
Hillier, Joseph William
3621050b-74de-4fb7-b1ee-968965966336
Li, Zuo
05f14f5e-fc6e-446e-ac52-64be640b5e42
Tomita, Isao
e4a78ed2-f525-4fb0-9711-86e2b2dd5587
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Rutt, Harvey
e09fa327-0c01-467a-9898-4e7f0cd715fc
Saito, Shinichi
14a5d20b-055e-4f48-9dda-267e88bd3fdc
Ibukuro, Kouta, Liu, Fayong, Husain, Muhammad K, Sotto, Moise Sala Henri, Hillier, Joseph William, Li, Zuo, Tomita, Isao, Tsuchiya, Yoshishige, Rutt, Harvey and Saito, Shinichi
(2020)
Silicon single-electron random number generator based on random telegraph signals at room temperature.
AIP Advances, 10 (11), [115101].
(doi:10.1063/5.0023647).
Abstract
The need for hardware random number generators (HRNGs) that can be integrated in a silicon (Si) complementary-metal-oxide-semiconductor (CMOS) platform has become increasingly important in the era of the Internet-of-Things (IoT). Si MOSFETs exhibiting random telegraph signals (RTSs) have been considered as such a candidate for HRNG, though its application has been hindered by RTS's variability and uncontrollable, unpredictable characteristics. In this paper, we report the generation and randomness evaluation of random numbers from RTSs in a Si single electron pump (SEP) device at room temperature. SEP devices are known to consistently produce RTSs due to a quantum dot electrically defined by multi-layer polycrystalline Si gates. Using RTSs observed in our devices, random numbers were extracted by a classifier supported by supervised learning, where part of data was used to train the classifier before it is applied to the rest to generate random numbers. The random numbers generated from RTSs were used as inputs for the Monte Carlo method to calculate the values of π, and the distribution was compared against the result obtained from the Mersenne Twister, a representative pseudo-random number generator (PRNG), under the same condition. π was estimated more than 80 000 times, and the distribution of the estimated values has a central value of 3.14 with a variance of 0.273, which is only twice as large as the result from PRNG. Our result paves a way to fully electronic CMOS compatible HRNGs that can be integrated in a modern system-on-a-chip in IoT devices.
Text
975548_1_merged_1599829642
- Author's Original
Text
ADV20-AR-02326
- Accepted Manuscript
More information
Submitted date: 12 September 2020
Accepted/In Press date: 12 October 2020
Published date: 2 November 2020
Additional Information:
Funding Information:
This work was supported by the EPSRC Manufacturing Fellowship (Grant No. EP/M008975/1), Lloyd’s Register Foundation International Consortium of Nanotechnologies, and the Joint Research Project [Grant No. e-SI-Amp (15SIB08)]. This work was also supported by the European Metrology Programme for Innovation and Research (EMPIR) co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation program.
Publisher Copyright:
© 2020 Author(s).
Identifiers
Local EPrints ID: 444748
URI: http://eprints.soton.ac.uk/id/eprint/444748
ISSN: 2158-3226
PURE UUID: 6d26b6cf-4b77-4944-a419-2c1c17a7b7dd
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Date deposited: 03 Nov 2020 17:30
Last modified: 06 Jun 2024 01:50
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Contributors
Author:
Kouta Ibukuro
Author:
Fayong Liu
Author:
Muhammad K Husain
Author:
Moise Sala Henri Sotto
Author:
Joseph William Hillier
Author:
Zuo Li
Author:
Isao Tomita
Author:
Yoshishige Tsuchiya
Author:
Harvey Rutt
Author:
Shinichi Saito
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