Picophotonics
Picophotonics
We demonstrate metrology and odometry (detection of change in position over time) with resolution in the nanometric - picometric scales by analyzing electrons or topologically structured light scattered from the nanostructures using artificial intelligence. We show how these techniques can be applied to characterization and optimization of nano-opto-mechanical metamaterials and the fundamental studies of dynamics of thermal motion and the physics of phonons in photonic nanostructures.
Rendon-Barraza, Carolina
8330193a-4b7d-45c8-8427-20de72e861b8
Chan, Eng Aik
8ddf6988-1cd5-445c-97e7-c3e0a9fef4f2
Li, Jinxiang
736c69a2-23ca-474f-a908-960235118fa8
Liu, Tongjun
53eb4a71-ea7b-4aa7-b96d-b70c5df1dd63
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Ou, Jun-Yu
3fb703e3-b222-46d2-b4ee-75f296d9d64d
Papas, Dimitrios
cff74106-c632-4f06-a2ff-55b204fab699
Papasimakis, Nikitas
f416bfa9-544c-4a3e-8a2d-bc1c11133a51
Plum, Eric
50761a26-2982-40df-9153-7aecc4226eb5
Pu, Tanchao
89eb5a37-31bf-469a-ae29-c871d5d25c65
Yuan, Guanghui
d7af6f06-7da9-41ef-b7f9-cfe09e55fcaa
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
2 August 2021
Rendon-Barraza, Carolina
8330193a-4b7d-45c8-8427-20de72e861b8
Chan, Eng Aik
8ddf6988-1cd5-445c-97e7-c3e0a9fef4f2
Li, Jinxiang
736c69a2-23ca-474f-a908-960235118fa8
Liu, Tongjun
53eb4a71-ea7b-4aa7-b96d-b70c5df1dd63
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Ou, Jun-Yu
3fb703e3-b222-46d2-b4ee-75f296d9d64d
Papas, Dimitrios
cff74106-c632-4f06-a2ff-55b204fab699
Papasimakis, Nikitas
f416bfa9-544c-4a3e-8a2d-bc1c11133a51
Plum, Eric
50761a26-2982-40df-9153-7aecc4226eb5
Pu, Tanchao
89eb5a37-31bf-469a-ae29-c871d5d25c65
Yuan, Guanghui
d7af6f06-7da9-41ef-b7f9-cfe09e55fcaa
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
Rendon-Barraza, Carolina, Chan, Eng Aik, Li, Jinxiang, Liu, Tongjun, MacDonald, Kevin F., Ou, Jun-Yu, Papas, Dimitrios, Papasimakis, Nikitas, Plum, Eric, Pu, Tanchao, Yuan, Guanghui and Zheludev, Nikolai
(2021)
Picophotonics.
15th International Congress on Artificial Materials for Novel Wave Phenomena, , Virtual Conference, United States.
20 - 25 Sep 2021.
Record type:
Conference or Workshop Item
(Paper)
Abstract
We demonstrate metrology and odometry (detection of change in position over time) with resolution in the nanometric - picometric scales by analyzing electrons or topologically structured light scattered from the nanostructures using artificial intelligence. We show how these techniques can be applied to characterization and optimization of nano-opto-mechanical metamaterials and the fundamental studies of dynamics of thermal motion and the physics of phonons in photonic nanostructures.
Text
MM congress invited - picophotonics
- Author's Original
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Published date: 2 August 2021
Venue - Dates:
15th International Congress on Artificial Materials for Novel Wave Phenomena, , Virtual Conference, United States, 2021-09-20 - 2021-09-25
Identifiers
Local EPrints ID: 447539
URI: http://eprints.soton.ac.uk/id/eprint/447539
PURE UUID: 8c8eec95-585c-4bc0-8d7c-c5427bbbefd6
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Date deposited: 15 Mar 2021 17:39
Last modified: 21 Nov 2024 05:02
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