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Dataset for: Probing hole spin transport of disorder quantum dots via Pauli spin-blockade in standard silicon transistors

Dataset for: Probing hole spin transport of disorder quantum dots via Pauli spin-blockade in standard silicon transistors
Dataset for: Probing hole spin transport of disorder quantum dots via Pauli spin-blockade in standard silicon transistors
Data set for: Hillier, J. W. et al. (2021). Probing hole spin transport of disorder quantum dots via Pauli spin-blockade in standard silicon transistors. Journal: IOP Nanotechnology
University of Southampton
Hillier, Joseph William
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Ono, Keiji
5c1cfe3a-9c61-4baa-8521-920ac56a0137
Ibukuro, Kouta
b863054f-39db-4e0e-a2cb-981a86820dda
Liu, Fayong
beec7ff8-5835-4793-981b-fafd99b52549
Li, Zuo
05f14f5e-fc6e-446e-ac52-64be640b5e42
Husain, Muhammad K
92db1f76-6760-4cf2-8e30-5d4a602fe15b
Rutt, Harvey
e09fa327-0c01-467a-9898-4e7f0cd715fc
Tomita, Isao
e4a78ed2-f525-4fb0-9711-86e2b2dd5587
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Ishibashi, K.
00663ab7-1cdb-4ab9-a9c3-36d80f17a727
Saito, Shinichi
14a5d20b-055e-4f48-9dda-267e88bd3fdc
Hillier, Joseph William
3621050b-74de-4fb7-b1ee-968965966336
Ono, Keiji
5c1cfe3a-9c61-4baa-8521-920ac56a0137
Ibukuro, Kouta
b863054f-39db-4e0e-a2cb-981a86820dda
Liu, Fayong
beec7ff8-5835-4793-981b-fafd99b52549
Li, Zuo
05f14f5e-fc6e-446e-ac52-64be640b5e42
Husain, Muhammad K
92db1f76-6760-4cf2-8e30-5d4a602fe15b
Rutt, Harvey
e09fa327-0c01-467a-9898-4e7f0cd715fc
Tomita, Isao
e4a78ed2-f525-4fb0-9711-86e2b2dd5587
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Ishibashi, K.
00663ab7-1cdb-4ab9-a9c3-36d80f17a727
Saito, Shinichi
14a5d20b-055e-4f48-9dda-267e88bd3fdc

Hillier, Joseph William (2021) Dataset for: Probing hole spin transport of disorder quantum dots via Pauli spin-blockade in standard silicon transistors. University of Southampton doi:10.5258/SOTON/D1485 [Dataset]

Record type: Dataset

Abstract

Data set for: Hillier, J. W. et al. (2021). Probing hole spin transport of disorder quantum dots via Pauli spin-blockade in standard silicon transistors. Journal: IOP Nanotechnology

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Joseph_Hillier_readme_IOP_NANO.txt - Text
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Raw_data.zip - Dataset
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More information

Published date: 19 March 2021

Identifiers

Local EPrints ID: 447663
URI: http://eprints.soton.ac.uk/id/eprint/447663
PURE UUID: 5523a9db-1bbd-47c7-aab6-82a7d8cc678c
ORCID for Joseph William Hillier: ORCID iD orcid.org/0000-0003-4418-0819
ORCID for Kouta Ibukuro: ORCID iD orcid.org/0000-0002-6546-8873
ORCID for Fayong Liu: ORCID iD orcid.org/0000-0003-4443-9720
ORCID for Shinichi Saito: ORCID iD orcid.org/0000-0003-1539-1182

Catalogue record

Date deposited: 18 Mar 2021 17:33
Last modified: 06 May 2023 01:47

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Contributors

Creator: Joseph William Hillier ORCID iD
Contributor: Keiji Ono
Contributor: Kouta Ibukuro ORCID iD
Contributor: Fayong Liu ORCID iD
Contributor: Zuo Li
Contributor: Muhammad K Husain
Contributor: Harvey Rutt
Contributor: Isao Tomita
Research team head: Yoshishige Tsuchiya
Contributor: K. Ishibashi
Research team head: Shinichi Saito ORCID iD

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