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Low-power electronic technologies for harsh radiation environments

Low-power electronic technologies for harsh radiation environments
Low-power electronic technologies for harsh radiation environments
Electronic technologies that can operate in harsh radiation environments are important in space, nuclear and avionic applications. However, radiation-hardened (rad-hard) integrated circuits often require additional processing and more complex configurations than conventional systems. Here we review the development of low-power, rad-hard electronics, examining the underlying phenomena of radiation-induced electronic failure and the design methodologies available with conventional complementary metal–oxide–semiconductor (CMOS) technologies to mitigate the problem. We also explore the potential use and applications of various emerging memory technologies in rad-hard electronics.
243-253
Prinzie, Jeffrey
b085d957-3c1f-409e-bdb6-1e38859ea300
Simanjuntak, Firman Mangasa
a5b8dd07-002c-4520-9f67-2dc20d2ff0d5
Leroux, Paul
669d9292-0fdc-4efd-bc66-f108bb3fcf05
Prodromakis, Themis
d58c9c10-9d25-4d22-b155-06c8437acfbf
Prinzie, Jeffrey
b085d957-3c1f-409e-bdb6-1e38859ea300
Simanjuntak, Firman Mangasa
a5b8dd07-002c-4520-9f67-2dc20d2ff0d5
Leroux, Paul
669d9292-0fdc-4efd-bc66-f108bb3fcf05
Prodromakis, Themis
d58c9c10-9d25-4d22-b155-06c8437acfbf

Prinzie, Jeffrey, Simanjuntak, Firman Mangasa, Leroux, Paul and Prodromakis, Themis (2021) Low-power electronic technologies for harsh radiation environments. Nature Electronics, 4 (4), 243-253. (doi:10.1038/s41928-021-00562-4).

Record type: Review

Abstract

Electronic technologies that can operate in harsh radiation environments are important in space, nuclear and avionic applications. However, radiation-hardened (rad-hard) integrated circuits often require additional processing and more complex configurations than conventional systems. Here we review the development of low-power, rad-hard electronics, examining the underlying phenomena of radiation-induced electronic failure and the design methodologies available with conventional complementary metal–oxide–semiconductor (CMOS) technologies to mitigate the problem. We also explore the potential use and applications of various emerging memory technologies in rad-hard electronics.

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Low_Power_Electronic_Technologies_in_Harsh_Radiation_Environments(1) - Accepted Manuscript
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More information

e-pub ahead of print date: 26 April 2021
Published date: April 2021
Additional Information: Funding Information: We acknowledge the support of EPSRC Programme Grant FORTE (EP/R024642/1), H2020-FETPROACT-2018-01 SYNCH, FWO (12P5319N), EU Horizon 2020 - RADSAGA (721624) and the RAEng Chair in Emerging Technologies (CiET1819/2/93). Publisher Copyright: © 2021, The Author(s), under exclusive licence to Springer Nature Limited. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

Identifiers

Local EPrints ID: 449055
URI: http://eprints.soton.ac.uk/id/eprint/449055
PURE UUID: a287d3d8-25ad-4f05-b2cd-6b6eb575bdfc
ORCID for Themis Prodromakis: ORCID iD orcid.org/0000-0002-6267-6909

Catalogue record

Date deposited: 14 May 2021 16:30
Last modified: 28 Apr 2022 04:19

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Contributors

Author: Jeffrey Prinzie
Author: Firman Mangasa Simanjuntak
Author: Paul Leroux
Author: Themis Prodromakis ORCID iD

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