Low-power electronic technologies for harsh radiation environments

Prinzie, Jeffrey, Simanjuntak, Firman Mangasa, Leroux, Paul and Prodromakis, Themis (2021) Low-power electronic technologies for harsh radiation environments. Nature Electronics, 4 (4), 243-253. (doi:10.1038/s41928-021-00562-4).

Record type: Review

Abstract

Electronic technologies that can operate in harsh radiation environments are important in space, nuclear and avionic applications. However, radiation-hardened (rad-hard) integrated circuits often require additional processing and more complex configurations than conventional systems. Here we review the development of low-power, rad-hard electronics, examining the underlying phenomena of radiation-induced electronic failure and the design methodologies available with conventional complementary metal–oxide–semiconductor (CMOS) technologies to mitigate the problem. We also explore the potential use and applications of various emerging memory technologies in rad-hard electronics.

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Low_Power_Electronic_Technologies_in_Harsh_Radiation_Environments(1) - Accepted Manuscript

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e-pub ahead of print date: 26 April 2021

Published date: April 2021

Additional Information: Funding Information: We acknowledge the support of EPSRC Programme Grant FORTE (EP/R024642/1), H2020-FETPROACT-2018-01 SYNCH, FWO (12P5319N), EU Horizon 2020 - RADSAGA (721624) and the RAEng Chair in Emerging Technologies (CiET1819/2/93). Publisher Copyright: © 2021, The Author(s), under exclusive licence to Springer Nature Limited. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.