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Advantages of a curved image plate for rapid laboratory-based x-ray total scattering measurements: application to pair distribution function analysis

Advantages of a curved image plate for rapid laboratory-based x-ray total scattering measurements: application to pair distribution function analysis
Advantages of a curved image plate for rapid laboratory-based x-ray total scattering measurements: application to pair distribution function analysis
The analysis and interpretation of the pair distribution function (PDF), as derived from total scattering measurements, is still seen by many as a technique confined to central synchrotron and neutron facilities. This situation has begun to change with a rising visibility of total scattering experiments reported in mainstream scientific journals and the modification of an increasing number of laboratory diffractometers. However, the rigor required during data reduction and the complexities of data interpretation mean the technique is still very far from being routine. Herein, we report the first application of a large area curved image plate system based on a Rigaku SPIDER (R-AXIS RAPID II) equipped with an Ag tube for collecting data amenable to high quality PDF refinement/modeling of crystalline, amorphous, and liquid samples. The advantages of such a system are the large Q range available without scanning (routinely in excess of 20 Å−1) and the inherent properties of an image plate detector (single photon sensitivity, large dynamic range [1.05 × 106], and effectively zero noise). Data are collected and structural models refined for a number of standard materials including NIST 640f silicon for which a Rwp ≤ 0.12 value was obtained with data collected in 60 min (excluding background measurements). These and other data are discussed and compared to similar examples in the literature.
0034-6748
Irving, Daniel John Michael
10331d1d-01b3-4c0b-86fe-65c127dfd225
Keen, David A.
1b3db186-cd71-4d0d-86e0-ce40213c237f
Light, Mark
cf57314e-6856-491b-a8d2-2dffc452e161
Irving, Daniel John Michael
10331d1d-01b3-4c0b-86fe-65c127dfd225
Keen, David A.
1b3db186-cd71-4d0d-86e0-ce40213c237f
Light, Mark
cf57314e-6856-491b-a8d2-2dffc452e161

Irving, Daniel John Michael, Keen, David A. and Light, Mark (2021) Advantages of a curved image plate for rapid laboratory-based x-ray total scattering measurements: application to pair distribution function analysis. Review of Scientific Instruments, 92 (4), [043107]. (doi:10.1063/5.0040694).

Record type: Article

Abstract

The analysis and interpretation of the pair distribution function (PDF), as derived from total scattering measurements, is still seen by many as a technique confined to central synchrotron and neutron facilities. This situation has begun to change with a rising visibility of total scattering experiments reported in mainstream scientific journals and the modification of an increasing number of laboratory diffractometers. However, the rigor required during data reduction and the complexities of data interpretation mean the technique is still very far from being routine. Herein, we report the first application of a large area curved image plate system based on a Rigaku SPIDER (R-AXIS RAPID II) equipped with an Ag tube for collecting data amenable to high quality PDF refinement/modeling of crystalline, amorphous, and liquid samples. The advantages of such a system are the large Q range available without scanning (routinely in excess of 20 Å−1) and the inherent properties of an image plate detector (single photon sensitivity, large dynamic range [1.05 × 106], and effectively zero noise). Data are collected and structural models refined for a number of standard materials including NIST 640f silicon for which a Rwp ≤ 0.12 value was obtained with data collected in 60 min (excluding background measurements). These and other data are discussed and compared to similar examples in the literature.

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RSI20-AR-02660_manuscript_rev - Accepted Manuscript
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Accepted/In Press date: April 2021
e-pub ahead of print date: 22 April 2021
Additional Information: Funding Information: D.J.M.I. acknowledges the EPSRC for DTP funding (Grant No. EP/R513325/1). Publisher Copyright: © 2021 Author(s). Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

Identifiers

Local EPrints ID: 449569
URI: http://eprints.soton.ac.uk/id/eprint/449569
ISSN: 0034-6748
PURE UUID: 298a8806-8350-4198-9605-0a8093b000ba
ORCID for Mark Light: ORCID iD orcid.org/0000-0002-0585-0843

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Date deposited: 08 Jun 2021 16:30
Last modified: 26 Nov 2021 02:42

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Contributors

Author: Daniel John Michael Irving
Author: David A. Keen
Author: Mark Light ORCID iD

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