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Angle-resolved spectrophotometry for the optical characterisation of material surfaces

Angle-resolved spectrophotometry for the optical characterisation of material surfaces
Angle-resolved spectrophotometry for the optical characterisation of material surfaces

Surface reflectance is a practical metric of the optical performance of a material. Applications, such as glass manufacturing, light sensing, satellite reflectors, and photovoltaics, depend on their reflectance properties and generalized optical performance. Reflectance measurements are rarely reported comprehensively, with only a single angle of incidence common in most datasets. Here, we present a new spectrophotometry system capable of performing angle-, wavelength-, and polarization-resolved reflectance measurements on various surfaces. Data from such a system yields significant information regarding the everyday, real-world performance of said materials. We perform exemplar studies by characterizing several standard thin-film antireflectance coatings and comparing the results to their known theoretical optical response. We also present results from measurements on an optical insulating material as well as a selection of wall paints to showcase the versatility of the technique. We highlight the parallels between measurement and theory, while analyzing the realistic implications of the measurements on their respective material's practical performance under real-world conditions.

angle-resolved, characterisation, materials, reflectance, spectrophotometry
0018-9456
Tyson, Jack
72808b94-f100-4205-9e7e-89405dca45ac
Rahman, Tasmiat
e7432efa-2683-484d-9ec6-2f9c568d30cd
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Tyson, Jack
72808b94-f100-4205-9e7e-89405dca45ac
Rahman, Tasmiat
e7432efa-2683-484d-9ec6-2f9c568d30cd
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8

Tyson, Jack, Rahman, Tasmiat and Boden, Stuart (2022) Angle-resolved spectrophotometry for the optical characterisation of material surfaces. IEEE Transactions on Instrumentation and Measurement, 71. (doi:10.1109/TIM.2022.3146947).

Record type: Article

Abstract

Surface reflectance is a practical metric of the optical performance of a material. Applications, such as glass manufacturing, light sensing, satellite reflectors, and photovoltaics, depend on their reflectance properties and generalized optical performance. Reflectance measurements are rarely reported comprehensively, with only a single angle of incidence common in most datasets. Here, we present a new spectrophotometry system capable of performing angle-, wavelength-, and polarization-resolved reflectance measurements on various surfaces. Data from such a system yields significant information regarding the everyday, real-world performance of said materials. We perform exemplar studies by characterizing several standard thin-film antireflectance coatings and comparing the results to their known theoretical optical response. We also present results from measurements on an optical insulating material as well as a selection of wall paints to showcase the versatility of the technique. We highlight the parallels between measurement and theory, while analyzing the realistic implications of the measurements on their respective material's practical performance under real-world conditions.

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Tyson2021 - FINAL_REVISED - Accepted Manuscript
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Accepted/In Press date: 12 January 2022
e-pub ahead of print date: 27 January 2022
Additional Information: Funding Information: This work was supported in part by the Centre for Doctoral Training in New and Sustainable Photovoltaics through the Engineering and Physical Sciences Research Council (EPSRC) under Grant EP/L01551X/1 and in part by Black Silicon Photovoltaics through EPSRC under Grant EP/R005303/1. Publisher Copyright: © 1963-2012 IEEE.
Keywords: angle-resolved, characterisation, materials, reflectance, spectrophotometry

Identifiers

Local EPrints ID: 454319
URI: http://eprints.soton.ac.uk/id/eprint/454319
ISSN: 0018-9456
PURE UUID: 4b2bffc7-a290-431e-b8a0-f0ed8f85b3be
ORCID for Jack Tyson: ORCID iD orcid.org/0000-0002-3112-5899
ORCID for Tasmiat Rahman: ORCID iD orcid.org/0000-0002-6485-2128
ORCID for Stuart Boden: ORCID iD orcid.org/0000-0002-4232-1828

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Date deposited: 07 Feb 2022 17:42
Last modified: 16 Jul 2024 01:46

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Contributors

Author: Jack Tyson ORCID iD
Author: Tasmiat Rahman ORCID iD
Author: Stuart Boden ORCID iD

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