Picophotonics: Visible invisible
Picophotonics: Visible invisible
The resolution of conventional microscopy is limited to a half of the wavelength of light. We report on recent advances in applications of deep learning and topologically structured light to far-field nondestructive imaging with deep subwavelength resolution and to picometric metrology.
Adamo, Giorgio
8c4da92b-f849-42d4-99c8-b0eb4ba1c73a
Aik Chan, Eng
803a26e6-c74c-47fe-943b-80f790955e3b
Li, Jinxiang
736c69a2-23ca-474f-a908-960235118fa8
Liu, Tongjun
53eb4a71-ea7b-4aa7-b96d-b70c5df1dd63
Kurdiumov, Sergei
ecd4ef31-4251-4703-bce6-2caee793b209
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Ou, Jun-Yu
3fb703e3-b222-46d2-b4ee-75f296d9d64d
Papasimakis, Nikitas
f416bfa9-544c-4a3e-8a2d-bc1c11133a51
Plum, Eric
50761a26-2982-40df-9153-7aecc4226eb5
Pu, Tanchao
89eb5a37-31bf-469a-ae29-c871d5d25c65
Rendon-Barraza, Carolina
8330193a-4b7d-45c8-8427-20de72e861b8
Wang, Yu
782c5e8b-7ff6-4f4f-9046-5b6410d21249
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
3 April 2022
Adamo, Giorgio
8c4da92b-f849-42d4-99c8-b0eb4ba1c73a
Aik Chan, Eng
803a26e6-c74c-47fe-943b-80f790955e3b
Li, Jinxiang
736c69a2-23ca-474f-a908-960235118fa8
Liu, Tongjun
53eb4a71-ea7b-4aa7-b96d-b70c5df1dd63
Kurdiumov, Sergei
ecd4ef31-4251-4703-bce6-2caee793b209
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Ou, Jun-Yu
3fb703e3-b222-46d2-b4ee-75f296d9d64d
Papasimakis, Nikitas
f416bfa9-544c-4a3e-8a2d-bc1c11133a51
Plum, Eric
50761a26-2982-40df-9153-7aecc4226eb5
Pu, Tanchao
89eb5a37-31bf-469a-ae29-c871d5d25c65
Rendon-Barraza, Carolina
8330193a-4b7d-45c8-8427-20de72e861b8
Wang, Yu
782c5e8b-7ff6-4f4f-9046-5b6410d21249
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
Adamo, Giorgio, Aik Chan, Eng, Li, Jinxiang, Liu, Tongjun, Kurdiumov, Sergei, MacDonald, Kevin F., Ou, Jun-Yu, Papasimakis, Nikitas, Plum, Eric, Pu, Tanchao, Rendon-Barraza, Carolina, Wang, Yu and Zheludev, Nikolai
(2022)
Picophotonics: Visible invisible.
SPIE Photonics Europe 2022, , Strasbourg, France.
03 Apr - 23 May 2022.
Record type:
Conference or Workshop Item
(Paper)
Abstract
The resolution of conventional microscopy is limited to a half of the wavelength of light. We report on recent advances in applications of deep learning and topologically structured light to far-field nondestructive imaging with deep subwavelength resolution and to picometric metrology.
Text
SPIE PE2022 picophotonics
- Author's Original
More information
Published date: 3 April 2022
Venue - Dates:
SPIE Photonics Europe 2022, , Strasbourg, France, 2022-04-03 - 2022-05-23
Identifiers
Local EPrints ID: 455919
URI: http://eprints.soton.ac.uk/id/eprint/455919
PURE UUID: 22791141-bc19-44d4-8d8c-6ada2c1c109d
Catalogue record
Date deposited: 08 Apr 2022 16:31
Last modified: 14 Dec 2024 05:02
Export record
Contributors
Author:
Giorgio Adamo
Author:
Eng Aik Chan
Author:
Jinxiang Li
Author:
Tongjun Liu
Author:
Sergei Kurdiumov
Author:
Kevin F. MacDonald
Author:
Jun-Yu Ou
Author:
Nikitas Papasimakis
Author:
Eric Plum
Author:
Tanchao Pu
Author:
Carolina Rendon-Barraza
Author:
Yu Wang
Author:
Nikolai Zheludev
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics