Group 16: Challenge: Task 3 - Detect defects in electron microscopy images
Group 16: Challenge: Task 3 - Detect defects in electron microscopy images
Our task is to design a model automatically detect defection in several graphene Sheets.From 256*256 whole graphene sheet, 48*48 subset patches are generated, see figure1. 32 patches of defected cases and 2279 patches of non-defected cases with ground truth information are provided. The defected patches are labelled as 1 and the non-detected ones are labelled as 0.
AI3SD, Machine Learning, Summer School
University of Southampton
Guo, Xuerui
c44a6885-0173-4475-a2a8-6286273524c8
Ma, Zien
715a01d0-44ed-49d4-9edd-9d2a8e3c14d4
Pal, Jayanta Kumar
d77e5f3f-12c4-4733-aed2-ce4321c0d762
Frey, Jeremy G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Niranjan, Mahesan
5cbaeea8-7288-4b55-a89c-c43d212ddd4f
Kanza, Samantha
b73bcf34-3ff8-4691-bd09-aa657dcff420
8 July 2022
Guo, Xuerui
c44a6885-0173-4475-a2a8-6286273524c8
Ma, Zien
715a01d0-44ed-49d4-9edd-9d2a8e3c14d4
Pal, Jayanta Kumar
d77e5f3f-12c4-4733-aed2-ce4321c0d762
Frey, Jeremy G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Niranjan, Mahesan
5cbaeea8-7288-4b55-a89c-c43d212ddd4f
Kanza, Samantha
b73bcf34-3ff8-4691-bd09-aa657dcff420
Guo, Xuerui, Ma, Zien and Pal, Jayanta Kumar
,
Frey, Jeremy G., Niranjan, Mahesan and Kanza, Samantha
(eds.)
(2022)
Group 16: Challenge: Task 3 - Detect defects in electron microscopy images
(AI4SD-Machine-Learning-Summer-School, 8)
University of Southampton
10pp.
(doi:10.5258/SOTON/AI3SD0251).
Record type:
Monograph
(Project Report)
Abstract
Our task is to design a model automatically detect defection in several graphene Sheets.From 256*256 whole graphene sheet, 48*48 subset patches are generated, see figure1. 32 patches of defected cases and 2279 patches of non-defected cases with ground truth information are provided. The defected patches are labelled as 1 and the non-detected ones are labelled as 0.
Text
MLSummerSchoolReport_Group16
- Version of Record
More information
Published date: 8 July 2022
Venue - Dates:
AI4SD Machine Learning Summer School, University of Southampton, Southampton, United Kingdom, 2022-06-20 - 2022-06-24
Keywords:
AI3SD, Machine Learning, Summer School
Identifiers
Local EPrints ID: 470690
URI: http://eprints.soton.ac.uk/id/eprint/470690
PURE UUID: da738993-6754-43df-bb1e-11a6184b2861
Catalogue record
Date deposited: 18 Oct 2022 16:36
Last modified: 17 Mar 2024 03:52
Export record
Altmetrics
Contributors
Author:
Xuerui Guo
Author:
Zien Ma
Author:
Jayanta Kumar Pal
Editor:
Mahesan Niranjan
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics