A new technique to measure shear fracture toughness of adhesives using tensile load
A new technique to measure shear fracture toughness of adhesives using tensile load
The end notched flexure (ENF) test is the most common method for measuring the mode II fracture energy of adhesives which provides reliable results but has some inherent problems. The shear fracture energy calculated using ENF for brittle adhesives is often based on a single data point (corresponding to the fracture load) obtained from the test where the crack grows catastrophically and the results are significantly sensitive to pre-crack tip conditions. The aim of the current study is to introduce a new pure mode II fracture test suitable for measuring the shear fracture energy of adhesives. A new technique for measuring the mode II critical strain energy release rate (SERR) of brittle adhesives is proposed based on the central cut ply (CCP) configuration. Fracture tests were carried out on adhesively bonded steel CCP specimens. It is shown that the crack growth in CCP joints is more stable, and the failure develops in multiple steps that generates more experimental data point during the crack propagation. The mode II fracture energy of a brittle epoxy-based adhesive is extracted using CCP method and is compared with the shear fracture energy obtained from the ENF tests. The effect of adhesive thickness on the obtained fracture energies is also analyzed. The CCP technique can be used to find both the crack initiation and crack propagation toughness values whereas the ENF method only provides the crack initiation fracture energy.
Safaei, S
3c1db302-bcfe-47bd-848b-cc191cdfde9a
Akhavan-Safar, A
7800a7cf-5244-48d8-b15f-f183dac8c717
Jalalvand, Meisam
21ef0df8-fc7c-4466-a2fc-ee98ed3408a2
da Silva, L.F.M.
7f33f165-a746-419f-a44d-295eca150087
22 December 2022
Safaei, S
3c1db302-bcfe-47bd-848b-cc191cdfde9a
Akhavan-Safar, A
7800a7cf-5244-48d8-b15f-f183dac8c717
Jalalvand, Meisam
21ef0df8-fc7c-4466-a2fc-ee98ed3408a2
da Silva, L.F.M.
7f33f165-a746-419f-a44d-295eca150087
Safaei, S, Akhavan-Safar, A, Jalalvand, Meisam and da Silva, L.F.M.
(2022)
A new technique to measure shear fracture toughness of adhesives using tensile load.
International Journal of Solids and Structures.
(doi:10.1016/j.ijsolstr.2022.112091).
Abstract
The end notched flexure (ENF) test is the most common method for measuring the mode II fracture energy of adhesives which provides reliable results but has some inherent problems. The shear fracture energy calculated using ENF for brittle adhesives is often based on a single data point (corresponding to the fracture load) obtained from the test where the crack grows catastrophically and the results are significantly sensitive to pre-crack tip conditions. The aim of the current study is to introduce a new pure mode II fracture test suitable for measuring the shear fracture energy of adhesives. A new technique for measuring the mode II critical strain energy release rate (SERR) of brittle adhesives is proposed based on the central cut ply (CCP) configuration. Fracture tests were carried out on adhesively bonded steel CCP specimens. It is shown that the crack growth in CCP joints is more stable, and the failure develops in multiple steps that generates more experimental data point during the crack propagation. The mode II fracture energy of a brittle epoxy-based adhesive is extracted using CCP method and is compared with the shear fracture energy obtained from the ENF tests. The effect of adhesive thickness on the obtained fracture energies is also analyzed. The CCP technique can be used to find both the crack initiation and crack propagation toughness values whereas the ENF method only provides the crack initiation fracture energy.
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Accepted/In Press date: 15 December 2022
e-pub ahead of print date: 20 December 2022
Published date: 22 December 2022
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Local EPrints ID: 475354
URI: http://eprints.soton.ac.uk/id/eprint/475354
ISSN: 0020-7683
PURE UUID: b3b44594-8e4a-44de-a30a-4b42bba8baf4
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Date deposited: 15 Mar 2023 18:01
Last modified: 17 Mar 2024 07:41
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Author:
S Safaei
Author:
A Akhavan-Safar
Author:
L.F.M. da Silva
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