Dataset supporting an article "Picophotonics localization metrology beyond thermal fluctuations".

Abstract

This dataset supports the publication: Picophotonic localization metrology beyond thermal fluctuations by Cheng-Hung Chi, Tongjun Liu, Jun-Yu Ou, Jie Xu, Eng Aik Chan, Kevin F. MacDonald, and Nikolay I. Zheludev in JOURNAL: Nature Materials The data file contains the as-recorded (unprocessed, uncropped, etc.) image files from which Fig. 2 and Fig. S1c are derived. [Figure 1 is a schematic graphic; Figure 3 shows the results of computational modelling, all details of which are contained within the manuscript]. Fig. 2. Optical measurements of nanowire displacement. a,b, Optically measured versus actual values of nanowire displacement for plane-wave (a) and topologically structured super oscillatory (b) illumination. Fig. S1. Fig. S1. Nanowire position calibration. (a) SEM image of the entire nanowire sample, showing the electrode configuration for electrostatic cont rol of [ x direction] position; (b) representative pair of high magnification images of the ( y direction) midpoint of the nanowire from which the dependence of nanowire displacement on applied bias panel (c) is derived. [Error bars in (c) denote the unc ertainty associated with a 1 pixel error in determining the nanowire edge position from SEM images. The project was sponsored by: Next Generation Metrology Driven by Nanophotonics EPSRC EP/T02643X/1 Dataset available under a CC BY 4.0 licence

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