Microstructural evolution and strain-hardening in TWIP Ti alloys
Microstructural evolution and strain-hardening in TWIP Ti alloys
A multiscale dislocation-based model was built to describe, for the first time, the microstructural evolution and strain-hardening of {332}⟨113⟩ TWIP (twinning-induced plasticity) Ti alloys. This model not only incorporates the reduced dislocation mean free path by emerging twin obstacles, but also quantifies the internal stress fields present at β-matrix/twin interfaces. The model was validated with the novel Ti-11Mo-5Sn-5Nb alloy (wt.%), as well as an extensive series of alloys undergoing {332}⟨113⟩ twinning at various deformation conditions. The quantitative model revealed that solid solution hardening is the main contributor to the yield stress, where multicomponent alloys or alloys containing eutectoid β-stabilisers exhibited higher yield strength. The evolution of twinning volume fraction, intertwin spacing, dislocation density and flow stress were successfully described. Particular attention was devoted to investigate the effect of strain rate on the twinning kinetics and dislocation annihilation. The modelling results clarified the role of each strengthening mechanism and established the influence of phase stability on twinning enhanced strain-hardening. Strain-hardening stems from the formation of twin obstacles in early stages, whereas the internal stress fields provide a long-lasting strengthening effect throughout the plastic deformation. A tool for alloy design by controlling TWIP is presented.
Physics-based modelling, Strain-hardening, Ti alloys, Twinning-induced plasticity
155-164
Zhao, Guo Hua
8d907d39-c1fd-42a4-add5-e180343dca3c
Xu, Xin
70c29754-0453-4dc3-950b-640a9ec20f7e
Dye, David
d46698b7-9fec-4f18-a1ba-e4714410f873
Rivera-Díaz-del-Castillo, Pedro E.J.
6e0abc1c-2aee-4a18-badc-bac28e7831e2
18 November 2019
Zhao, Guo Hua
8d907d39-c1fd-42a4-add5-e180343dca3c
Xu, Xin
70c29754-0453-4dc3-950b-640a9ec20f7e
Dye, David
d46698b7-9fec-4f18-a1ba-e4714410f873
Rivera-Díaz-del-Castillo, Pedro E.J.
6e0abc1c-2aee-4a18-badc-bac28e7831e2
Zhao, Guo Hua, Xu, Xin, Dye, David and Rivera-Díaz-del-Castillo, Pedro E.J.
(2019)
Microstructural evolution and strain-hardening in TWIP Ti alloys.
Acta Materialia, 183, .
(doi:10.1016/j.actamat.2019.11.009).
Abstract
A multiscale dislocation-based model was built to describe, for the first time, the microstructural evolution and strain-hardening of {332}⟨113⟩ TWIP (twinning-induced plasticity) Ti alloys. This model not only incorporates the reduced dislocation mean free path by emerging twin obstacles, but also quantifies the internal stress fields present at β-matrix/twin interfaces. The model was validated with the novel Ti-11Mo-5Sn-5Nb alloy (wt.%), as well as an extensive series of alloys undergoing {332}⟨113⟩ twinning at various deformation conditions. The quantitative model revealed that solid solution hardening is the main contributor to the yield stress, where multicomponent alloys or alloys containing eutectoid β-stabilisers exhibited higher yield strength. The evolution of twinning volume fraction, intertwin spacing, dislocation density and flow stress were successfully described. Particular attention was devoted to investigate the effect of strain rate on the twinning kinetics and dislocation annihilation. The modelling results clarified the role of each strengthening mechanism and established the influence of phase stability on twinning enhanced strain-hardening. Strain-hardening stems from the formation of twin obstacles in early stages, whereas the internal stress fields provide a long-lasting strengthening effect throughout the plastic deformation. A tool for alloy design by controlling TWIP is presented.
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1-s2.0-S1359645419307372-main
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Accepted/In Press date: 3 November 2019
e-pub ahead of print date: 8 November 2019
Published date: 18 November 2019
Keywords:
Physics-based modelling, Strain-hardening, Ti alloys, Twinning-induced plasticity
Identifiers
Local EPrints ID: 492070
URI: http://eprints.soton.ac.uk/id/eprint/492070
ISSN: 1359-6454
PURE UUID: 16c7f24c-46f0-455a-b21c-572587f4d198
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Date deposited: 15 Jul 2024 16:53
Last modified: 16 Jul 2024 02:05
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Contributors
Author:
Guo Hua Zhao
Author:
Xin Xu
Author:
David Dye
Author:
Pedro E.J. Rivera-Díaz-del-Castillo
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