Halak, Basel, Tenentes, Vasileios and Rossi, Daniele (2016) Data-set supporting the article entitled "The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology". University of Southampton doi:10.5258/SOTON/403411 [Dataset]
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Dataset
Abstract
This data-set supports the article entitled "The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology", accepted for the publication in Microelectronics Reliability DOI:10.1016/j.microrel.2016.10.018
More information
Published date: 2016
Related URLs:
Organisations:
EEE, Electronic & Software Systems, Electronics & Computer Science
Projects:
Resilient and Testable Energy-Efficient Digital Hardware
Funded by: UNSPECIFIED (EP/K000810/1)
1 March 2013 to 29 February 2016
Identifiers
Local EPrints ID: 403411
URI: http://eprints.soton.ac.uk/id/eprint/403411
PURE UUID: 4dc95f2c-8a38-4a0b-a14a-a569d8b4dde5
Catalogue record
Date deposited: 02 Dec 2016 17:22
Last modified: 05 Nov 2023 02:45
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Contributors
Creator:
Basel Halak
Creator:
Vasileios Tenentes
Creator:
Daniele Rossi
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